WRTLT 2008 - Call for Participation

CALL FOR PARTICIPATION

Scope -- Key Dates -- Workshop Registration -- Advance Program -- More Information -- Committees

Scope

The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing. Areas of interest include:

High level Testing -- RTL/Behavior level testing, High level approaches for testing, RTL ATPG, RTL DFT, RTL BIST, Synthesis for testability, Relationship between RTL and gate level testing, Functional fault modeling, High level test bench generation
SoC Testing -- Test scheduling, Core testing, Interconnect testing, NoC testing
Reliable SoC -- System level reliability, Self repair, Fault tolerant SoC
Micro Processor Testing
Design Verification(6) Gate Level Test Related Issues -- Low power testing, Test compression, ATPG, DFT, BIST

Key Dates

top

Advance registration deadline: October 24, 2008

Workshop Registration

top

Registration forms are now available in PDF and DOC formats on the website.

Advance Program

top

This year we set up the theme of "Power/Thermal-Aware Testing", which we believe needs to be discussed not only at gate level but also from high level in this workshop. The following keynote speech, invited talk, and panel discussion on this theme will be scheduled in the afternoon of the first day, November 27.

Keynote Speech: "Power-Aware System-on-Chip Testing" by Erik Larsson, Linkopings University, Sweden

Invited Talk: " Power: The New Dimension of Test" by Patrick Girard, LIRMM, France

Panel: "Roads to Power-Safe LSI Testing"
Organizer: K. Hatayama, Semiconductor Technology Academic Research Center, Japan
Moderator: X. Wen, Kyushu Institute of Technology, Japan

Panelists:

M. Teheranipoor, University of Connecticut, USA
C. P. Ravikumar, Texas Instruments India, Pvt. Ltd., India
K. Ishibashi, Renesas Technology Corp., Japan
K. Chakravadhanula, Cadence Design Systems, Inc. USA

Twenty three papers in the WRTLT'08 scope will be presented in regular sessions. The advance program will be available by the end of September on our web-site.

More Information

top

For further information please visit the website or email wrtlt08@aries30.cse.kyutech.ac.jp.

Committees

top

General Chair
Tomoo Inoue, Hiroshima City University

General Vice-Chair
Toshinori Hosokawa, Nihon University

Program Chair
Tsuyoshi Shinogi, Mie University

Finance Chair
Satoshi Ohtake, NAIST

Publicity Chair
Xiaoqing Wen, Kyushu Institute of Technology

Publication Chair
Tomokazu Yoneda, NAIST

Registration Chair
Hiroyuki Yotsuyanagi, Tokushima University

Local Arrangement Chair
Hiroshi Yokoyama, Akita University

Audio Visual Chair
Masayuki Arai, Tokyo Metropolitan University

Secretary
Hideyuki Ichihara, Hiroshima City University

Ex Officio
Hideo Fujiwara , NAIST

Program Committee

Takashi Aikyo, Japan
JiNian Bian, China
Krishnendu Chakrabarty, USA
Tsin-Yuan Chang, Taiwan
Satoshi Fukumoto, Japan
Masaki Hashizume, Japan
Kazumi Hatayama, Japan
Terumine Hayashi, Japan
Yu Hu, China
Michiko Inoue, Japan
Hideo Ito, Japan
Kazuhiko Iwasaki, Japan
Seiji Kajihara, Japan
Erik Larsson, Sweden
Hua-Wei Li, China
Xiao-Wei Li, China
Zainalabedin Navabi, USA
Chia Yee Ooi, Malaysia
Alex Orailoglu, USA
Ilia Polian, Germany
Jaan Raik, Estonia
Kewal K. Saluja, USA
Hideo Tamamoto, Japan
Dong Xiang, China
ZhiQiang You, China
Danella Zhao, USA

Steering Committee

Chair: Xiaowei Li, China
Vice-Chair: Tomoo Inoue, Japan
Members:
  Hideo Fujiwara, Japan
  Terumine Hayashi, Japan
  Kazuhiko Iwasaki, Japan
  Erik Larsson, Sweden
Alex Orailoglu, USA
  Kewal K. Saluja, USA
  Hideo Tamamoto, Japan
  Dong Xiang, China
  Dafang Zhang, China

For more information, visit us on the web at: http://www.event URL.com

The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT08) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), and the Technical Group on Dependable Computing, IEICE .